The
11th EUFANET workshop focused on Failure Analysis of
Analog Devices. This year’s workshop topic dealt with the characterisation
and analysis of analog ICs. Many failure localisation
techniques that have been honed over the years on digital
devices are not, or no longer, applicable to analog
units. On the other hand, analog circuitry is increasingly
(and again!) prevalent in microelectronics as standalone
devices, or in combination with MEMS sensors or short-distance
RF transmissions. This workshop has been held during the ESREF 2010 conference
in Gaeta, Italy. 40 people attended this exiting
workshop where we had great technical exchanges and
discussions which followed the presentations:
Welcome
& Workshop introduction (Philippe Perdu, CNES)
EUFANET
status (Jean-Philippe Roux, Sector Technologies)
Technical
presentations:
Analog
IC sample prep (Matthew Lefevre, Digit Concept)
Variation
mapping for analog devices (Philippe Perdu, CNES;
Olivier Crepel, Freescale)
Analogue
measurement with emiscope (Frank Zachariasse, NXP)
Measuring
transistors characteristics of sub-32nm devices with
SEM-based nano-probing system (Stefan Kleindick, Kleindick)
Nanoprobing
and CAFM for 16 nm elementary structures (Matthew
Lefevre, Digit Concept)
Round
table with the audience
We
thank all the speakers for contributing to the EUFANET
workshop. !
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