Base Peak from Wiley, A comprehensive www resource for mass spectrometry. Developed by Wiley and based on Kermit Murrays mass spectrometry on the internet www site. This is a must visit site for information on mass spectrometry.

Dimension 5000 Atomic Force Microscope, The Dimension 5000 AFM system is used as the metrology tool for semiconductor and data storage device manufacturers, and has been proven the utility of AFM for nanometer-scale measurements on large samples.

FEI's Tools for Nanotech(TM), featuring focused ion- and electron-beam technologies, deliver 3D characterization, analysis and modification capabilities with resolution down to the sub-Ångström level.

IDS OptiFIB , Credence, can identify and repair circuit layout at the inner metal layers. It is the first focused ion beam instrument to combine ion and photon optics in a single coaxial column. The unique design combines with a CAD navigation interface to enable the user to align FIB and CAD images simultaneously for greater accuracy of circuit modifications.

Microscopy Production & Sales, from Petr’s Microscopy Resources, It is the list of  producers and vendors.

Microscopy.info, includes 1). Buyers Guide for microscopy , which contains companies organized by product category. The categories are: Electron Microscopy, Light Microscopy, Imaging, Scanning Probe & Inspection, Microanalysis, Preparation. 2). Directory of Manufactors and Vendors has over 3,000 listings. You will find direct links to websites, emails, addresses, and phone numbers. 3). Resources section includes a hyper-linked glossary, technical information, links to the best microscopy sites, product news, and technical articles. 4). Directories is for looking for microscope service or a microscopy laboratory. etc

Microscopy Vendors, a complete microscopy vendor list.

Microscopy Courses & Software, from Petr’s Microscopy Resources. The links for Tips, E-Learning and Software can be found here.

Microscopy Information Resources, from Petr’s Microscopy Resources

Microscopy and Failure Analysis, Nikon L200 system which is an optical microscope, and SM300 systeme which is a SEM, are introduced briefly in the website.

Scanning Electron Microscopy, provides a very complete coverage of basics and written for a wide audience. It includes principles of the method, practical aspects of the method, method automation, data analysis and initial interpretation, sample preparation and specimen modification.

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