What
does EUFANET mean?
EUFANET
stands for EUropean
Failure
Analysis
NETwork
What
is EUFANET?
EUFANET is a network dedicated to failure analysis
of electronic components (VLSI, other ICs, passives
like resistors and actives like diodes or transistors,
opto) and assembly (back-end, PCB, hybrids and connectors).
The aim of this network is to boost technical information
exchange for Failure Analysis community at European
level. more
info
ANADEF Workshop
The 15th ANADEF workshop (Failure
Analysis and failure mechanisms of electronic components) was held from June 7 to
10, 2016, at the sea resort Les Tuquets in Seignosse, south of France, near the
famous surfing spot of Hossegor on the Atlantic Ocean.
Training and sharing of
experiences and skills on solved and unsolved failure analysis (FA) cases
studies, techniques, and tools, as well as trends and the future of FA are
presented in warm, friendly, and informal but professional manner that includes
extended after-dinner exchanges.
It is
a record this year; the ANADEF workshop gathered 152 people from a wide
industrial and university background: IC manufacturers, energy, aeronautics,
space, defence, automotive, tool and equipment suppliers and FA lab providers.
Almost 50% of attendees were new comers and offered opportunity to enlarge our
network.
More info on ANADEF web site www.anadef.org
CAM / EUFANET- Industry Workshop
The CAM / EUFANET- industry workshop (Wednesday, 21 September 2016, 09:30 – 18:10) will focus on the important topic of automotive electronics from the system perspective. Future challenges arising from autonomous driving and the increased market performance of electric cars will be highlighted. Presentations this year include talks from car OEMs and leading component and system suppliers. More info
ESREF
2016, the 27th European Symposium on Reliability of Electron Devices,
Failure Physics and Analysis will take place in Halle (Saale), Germany
from September 19th to 22nd, 2016.
The conference continues to
focus on recent developments and future directions in quality,
robustness and reliability research of materials, components, integrated
electronic circuits/systems and their nano-, micro-, power-,
optoelectronics devices. ESREF provides the leading European forum for
developing all aspects of reliability management and failure prevention
for present and future electronics. ESREF 2016 will have a specific
focus on reliability issues in automotive electronics.
Visit ESREF website
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Plan Today to Attend ISTFA 2016, November 6-10, 2016, at the Fort Worth Convention Center in Fort Worth, Texas, USA!
This year's theme is The Next Generation FA Engineer.
Change is the only constant in the Failure Analysis world. There is always the Next Generation technology to be understood, the Next Generation material to be learned, the Next Generation equipment to be mastered. In this changing world, the Next Generation constantly challenges the knowledge of today's engineers. The International Symposium for Testing and Failure Analysis (ISTFA) answers this challenge. At ISTFA, you can learn from the experts, network with people who can support your work, explore the latest apps and tools for the failure analysis lab, and become a knowable presenter yourself, teaching others. ISTFA offers opportunities for all levels of proficiency, from the Next Generation of engineers, who seek to boost their starting career, to expert engineers, who seek insight into Next Generation challenges already today.
Visit ISTFA website
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