Web site last update is 19 July 2016

 

EUFANET Info 
Technical stuff 
Workshops 
Yellow pages 
Workgroups 
Contacts 
Sitemap 

 

 

 

 

Welcome to EUFANET Web site

 

  What does EUFANET mean?

EUFANET stands for EUropean Failure Analysis NETwork

 

  What is EUFANET?

EUFANET is a network dedicated to failure analysis of electronic components (VLSI, other ICs, passives like resistors and actives like diodes or transistors, opto) and assembly (back-end, PCB, hybrids and connectors). The aim of this network is to boost technical information exchange for Failure Analysis community at European level.  more info

 

 

  

ANADEF Workshop

The 15th ANADEF workshop (Failure Analysis and failure mechanisms of electronic components) was held from June 7 to 10, 2016, at the sea resort Les Tuquets in Seignosse, south of France, near the famous surfing spot of Hossegor on the Atlantic Ocean.

Training and sharing of experiences and skills on solved and unsolved failure analysis (FA) cases studies, techniques, and tools, as well as trends and the future of FA are presented in warm, friendly, and informal but professional manner that includes extended after-dinner exchanges.

It is a record this year; the ANADEF workshop gathered 152 people from a wide industrial and university background: IC manufacturers, energy, aeronautics, space, defence, automotive, tool and equipment suppliers and FA lab providers. Almost 50% of attendees were new comers and offered opportunity to enlarge our network.

More info on ANADEF web site www.anadef.org

 

CAM / EUFANET- Industry Workshop

The CAM / EUFANET- industry workshop (Wednesday, 21 September 2016, 09:30 – 18:10) will focus on the important topic of automotive electronics from the system perspective. Future challenges arising from autonomous driving and the increased market performance of electric cars will be highlighted. Presentations this year include talks from car OEMs and leading component and system suppliers. More info

 

 

ESREF 2016, the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis will take place in Halle (Saale), Germany from September 19th to 22nd, 2016.

The conference continues to focus on recent developments and future directions in quality, robustness and reliability research of materials, components, integrated electronic circuits/systems and their nano-, micro-, power-, optoelectronics devices. ESREF provides the leading European forum for developing all aspects of reliability management and failure prevention for present and future electronics. ESREF 2016 will have a specific focus on reliability issues in automotive electronics.

Visit ESREF website

 

Plan Today to Attend ISTFA 2016, November 6-10, 2016, at the Fort Worth Convention Center in Fort Worth, Texas, USA!

This year's theme is The Next Generation FA Engineer.

Change is the only constant in the Failure Analysis world. There is always the Next Generation technology to be understood, the Next Generation material to be learned, the Next Generation equipment to be mastered. In this changing world, the Next Generation constantly challenges the knowledge of today's engineers. The International Symposium for Testing and Failure Analysis (ISTFA) answers this challenge. At ISTFA, you can learn from the experts, network with people who can support your work, explore the latest apps and tools for the failure analysis lab, and become a knowable presenter yourself, teaching others. ISTFA offers opportunities for all levels of proficiency, from the Next Generation of engineers, who seek to boost their starting career, to expert engineers, who seek insight into Next Generation challenges already today.

Visit ISTFA website

 

 

European FA Lab « Yellow Pages »

Eufanet is constructing a European Failure Analysis Laboratory List  which tries to contain all the labs with a list of techniques and capabilities in Europe that are in some way dedicated to failure analyse. The list is thought to be something like extended yellow pages and is open for every Lab somehow (even only slightly) related to failure analysis. It is free of charge and obligations, more information and to how to participate: yellow page

 

 

 

Copyright(c) 2001-2011 EUFANET. All rights reserved.

webmaster@eufanet.org